xk, Incorporated is a small privately owned business, incorporated in 1994 in the state of Delaware, with offices in San Francisco, California, Clackamas, Oregon, Manassas, Virginia, and Yardley, Pennsylvania. As a company we have collectively over 60 years experience in microanalysis, image analysis, x-ray fluorescence (XRF) and systems integration. We have developed the software and firmware for several Energy Dispersive Spectroscopy (EDS), Wavelength Dispersive Spectroscopy (WDS), and image analysis systems. Our development included the analytical algorithms, data acquisition, user-interfaces, graphics, device drivers, x-ray mapping, basic image collection, image processing, feature analysis, and critical dimension analysis. Along the way, we also developed software for DNA analysis, and for identifying small shifts ( < 10 ev ) in x-ray peak positions due to chemical bonding and valence state. Many of the unique algorithms we developed are currently in use by other Microanalysis and EDS companies. However we are still unique in our development of Fuzzy Logic assisted microanalysis (FLAME™), and our development of an EDS database system (SLICE™) currently in use at the FBI and other leading forensics laboratories for the identification and archival of EDS and XRF spectra from trace evidence.